Objective:
To identify high-confidence, large-effect risk genes contributing to obsessive-compulsive disorder (OCD) and chronic tic disorders (CTDs).
Approach:
- Study Design: Utilized whole-exome sequencing data from 3,964 patients, including parent-proband trios and singletons, alongside control data from neurotypical sibling-parent trios and parents of European ancestry.
- Genetic Analysis: Evaluated rare de novo and other rare protein-damaging variants for enrichment and conducted gene-level analyses to identify associated genes.
Key Findings:
- Identified 12 high-confidence risk genes for OCD and 10 for CTDs.
- A total of 36 genes met the high-confidence threshold in at least one analysis, a significant increase from 4 previously identified genes.
- Approximately 7% to 8% of patients with OCD and/or CTDs carried at least one risk-contributing de novo damaging variant.
- 83% of the identified genes showed evidence from patients with both OCD and CTDs.
- High-confidence genes showed increased postnatal expression in the cerebellum and prenatal enrichment across several brain regions.
Interpretation:
The findings indicate substantial genetic overlap between OCD and CTDs, with shared genetic and neurobiological features.
Limitations:
- Incorporated previously reported samples, not designed as an independent replication.
- Focused on rare coding variants, excluding other genetic variations like copy-number and noncoding variants.
- Genotype-phenotype analyses limited by incomplete clinical information and small subgroup sizes.
- Singleton analyses restricted to patients of European ancestry.
Conclusion:
The study expands the number of high-confidence, large-effect genes implicated in OCD and CTDs, highlighting the need for further research on the functional consequences of the mutations.
Sources:
This content is an AI-generated, fully rewritten summary based on a published scholarly article. It does not reproduce the original text and is not a substitute for the original publication. Readers are encouraged to consult the source for full context, data, and methodology.
